Semiconductor light emitting devices with non-epitaxial upper cladding

ABSTRACT

The AlGaN upper cladding layer of a nitride laser diode is replaced by a non-epitaxial layer, such as metallic silver. If chosen to have a relatively low refractive index value, the mode loss from absorption in the non-epitaxial cladding layer is acceptably small. If also chosen to have a relatively high work-function, the non-epitaxial layer forms an electrical contact to the nitride semiconductors. An indium-tin-oxide layer may also be employed with the non-epitaxial cladding layer.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a continuation of copending U.S. Applicationfor Letters Patent titled “Semiconductor Light Emitting Devices WithNon-Epitaxial Upper Cladding”, Ser. No. 12/237,106, filed on Sep. 24,2008, which in its entirety is hereby incorporated herein by referenceand to which priority is claimed.

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH AND DEVELOPMENT

This invention was made with Government support under W911NF-08-C-0003awarded by DARPA. Therefore, the Government has certain rights in thisinvention.

BACKGROUND

The present disclosure is related to semiconductor light emittingdevices, and more particularly to structures with an alternative totraditional cladding layers, and method of producing same.

Semiconductor laser diodes (LDs) emitting in the range of 500 nm, alsoknown as green-wavelength LDs are of current technical interest for avariety of applications, such as full-color visible displays(complementing the existing red and blue LDs), undersea communication,etc. Although nitride ultraviolet (λ<380 nm), near-UV (λ≈405 nm), andviolet-blue (405 nm≦λ≦470 nm) laser diodes have been demonstrated andproduced commercially, their performance deteriorates for longerwavelengths. The sources of this reduced performance are numerous.First, longer wavelengths imply an active indium-gallium-nitride (InGaN)region of higher indium content. These alloys experience greater strainwith respect to the GaN template they are typically formed upon. Thehigher strain may be responsible for structural defects that destroy theinternal quantum efficiency; and the greater strain is also responsiblefor a greater piezoelectric field across the quantum wells, which alsoreduces the radiative efficiency by separating the injected electronsand holes. Accordingly, significant research is being undertakenrelating to nonpolar or semipolar orientations of GaN.

FIG. 1 shows a generic nitride laser diode structure 10. Portion 12 ofFIG. 1 shows a bandgap-energy representation, and portion 14 shows thecorresponding refractive index profile associated with this structure.An optimized LD structure achieves both strong carrier confinement andoptical confinement. The carrier confinement is realized by includinghigh-bandgap alloys in the heterostructure, specifically in the claddinglayers surrounding the quantum well active layer. A cladding layerhaving a low refractive index produces strong optical confinement.

The range of alloys to form such heterostructures is limited, however,to compositions that are not excessively strained with respect to theunderlying layer (such as GaN). Thus, another challenge associated withforming a green laser diode is the difficulty of achieving adequateoptical confinement. This is a consequence of both the smallerrefractive-index differences (i.e., lower dispersion) of InGaN alloys atlonger wavelengths, the longer wavelength itself (since the mode sizescales with wavelength), and the strain limitations that may precludeusing AlGaN cladding layers (which are tensile-strained and prone tocracking). Accordingly, described herein is an alternative nitride laserstructure where the upper cladding layer is other than AlGaN.Investigations into alternative upper cladding layers has led to therealization that such alternative cladding layers may have applicabilitynot only in the green wavelength devices, but in many other devices suchas those emitting in the violet-blue, red, and infra-red region. Thisdisclosure explores such structures and their applications.

SUMMARY

Accordingly, the present disclosure is directed to semiconductor lightemitting devices, such as laser diodes and superluminescentlight-emitting diodes, which include a non-epitaxial upper claddinglayer as compared to the traditional epitaxial upper cladding layer.According to one aspect of the present invention, the upper cladding isformed of a low electrical resistivity material, for example having anelectrical resistivity of less than 1 Ω-cm. Such an upper cladding layermay be comprised of a material having a low refractive index for thewavelength of emission, for example, refractive index not exceeding 0.3for wavelengths in the range of 350-550 nm. In one embodiment, thematerial forming the upper cladding layer is silver (Ag), although othermetals and non-metallic materials may be employed in appropriateapplications.

According to one aspect of the disclosure, a semiconductor laser diodeis provided which comprises a substrate; a planar crystallinesemiconductor cladding layer formed over said substrate; a confinementheterostructure formed over said crystalline semiconductor claddinglayer; an active region formed within said confinement heterostructure;and a planar non-epitaxial cladding layer formed over said confinementheterostructure, said non-epitaxial cladding layer having an electricalresistivity less than 1 ohm-cm; whereby, said crystalline semiconductorcladding layer and non-epitaxial cladding layer together form awaveguide that guides light in the plane of said cladding layers. Theconfinement heterostructure may, for example, be comprised of bulkindium gallium nitride (InGaN) or an InGaN short-period superlattice.

According to another embodiment of the present invention, the uppercladding layer may also serve as the upper p-contact for the device,eliminating the need to form a separate, additional contact layer.Additional materials such as gold (Au) can be deposited above the uppercladding layer for improved environmental protection or for wirebondingor soldering.

According to yet another embodiment of the present invention, anoptically transparent conductive material such as indium tin oxide (ITO)may be provided between said confinement heterostructure and saidnon-epitaxial cladding layer as a phase matching layer to improveoptical confinement.

According to still another embodiment of the present invention, theupper cladding layer may be formed as a stripe to provide anindex-guided structure, or as a periodic grating comprisingdiscontinuous lateral waveguide elements to form either a lateral ridgewaveguide or lateral gain guide structure.

The problem of optical confinement in longer wavelength devices isaddressed by the structures described above and herein. Outside of suchlonger wavelength devices, the alternative upper cladding structure alsoprovides a combined cladding and contact structure, simplifying devicemanufacturing.

While a conventional laser diode heterostructure contains both lower(e.g., n-type) and upper (e.g., p-type) epitaxial cladding layers, thecurrent invention eliminates the need for the upper epitaxial claddinglayer. This addressed another problem: inclusion of an epitaxial uppercladding layer increases the material and complexity of a laserstructure. Forming a device without a semiconducting p-AlGaN claddinglayer simplifies the structure, and can lower both the series resistanceand thermal resistivity, and inhibit cracking.

Furthermore, the formation of additional materials over the activeregion has, in many applications, required relatively high temperaturedeposition processes. These high temperature processes have been foundto degrade the active layer. The present invention addresses thisproblem by requiring only minimal additional material over the activeregion. The InGaN QW quality may be preserved against degradationassociated with the time/temperature exposure associated with growth ofa thick p-AlGaN cladding layer. This benefit is especially significantfor high-indium content structures, due to the inherent thermalinstability of InGaN.

The above is a summary of a number of the unique aspects, features, andadvantages of the present disclosure. However, this summary is notexhaustive. Thus, these and other aspects, features, and advantages ofthe present disclosure will become more apparent from the followingdetailed description and the appended drawings, when considered in lightof the claims provided herein.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings appended hereto like reference numerals denote likeelements between the various drawings. While illustrative, the drawingsare not drawn to scale. In the drawings:

FIG. 1 is an illustration of a prior art nitride laser diode structure,showing a bandgap-energy representation, and a corresponding refractiveindex profile.

FIGS. 2A and 2B are cross-section cut-away views of a semiconductorlight emitting device according to first and second embodiments of thepresent invention, respectively.

FIG. 3 is a plot of the complex index, ñ=n+iκ, values for silver.

FIG. 4 is a cross-section cut-away view of a semiconductor lightemitting device illustrating the constitution of the active regionstructure according to an embodiment of the present invention.

FIG. 5 is a graph of the aggregate confinement factor (Γ) value for aconventional 405 nm laser, as a function of the number of 3 nm InGaNQWs, for a 4 QW, 500 nm LD with silver cladding having an AlGaN lowercladding layer thicknesses (Al_(0.07)GaN) of 0, 250 nm, 500 nm, and 1000nm thickness, and for 250 nm Al_(0.15)GaN.

FIG. 6 is graph of the transverse near-field mode intensity profile isfor the case of no AlGaN lower cladding layer (i.e., the lower claddingis entirely GaN).

FIG. 7 is a graph of the aggregate confinement factor (Γ) value and themode loss due to the metal cladding, along with the values for aconventional 405 nm 4×3 nm In_(0.1)GaN QW LD.

FIG. 8 is a cross-section cut-away view of a semiconductor lightemitting device including a transparent conductor such asindium-tin-oxide (ITO) between the metal and the p-type semiconductorsurface according to an embodiment of the present invention.

FIG. 9 is a graph illustrating measured dispersion characteristics ofthe structure illustrated in FIG. 8.

FIG. 10 is perspective view of a semiconductor light emitting deviceformed to have a ridge waveguide comprised of a silver and ITO claddingstructure according to an embodiment of the present invention.

FIGS. 11A and 11B are perspective view and cut-away side views,respectively, of a semiconductor light emitting device having a metalcladding layer comprised of a grating of periodic stripes of silvermetal forming a lateral ridge waveguide according to an embodiment ofthe present invention.

FIG. 12 is perspective view and cut-away side view of a semiconductorlight emitting device having a metal cladding layer comprised of agrating of periodic stripes of silver metal forming a gain-guidedwaveguide according to an embodiment of the present invention.

FIG. 13 is a cross-section view of an Ag-clad nitride LD structureaccording to an embodiment of the present invention.

FIG. 14 is graph of the room-temperature, pulsed (100 nsec pulse, 1 kHZrepetition rate) light vs. current characteristic for a 12 μm×1000 μmsilver clad nitride laser diode according to the embodiment shown inFIG. 13.

FIG. 15 is a graph showing the emission spectrum of a 12 μm×1000 μmsilver clad nitride laser diode measured at pulsed current of 1.5 Aaccording to the embodiment shown in FIG. 13.

FIG. 16 is a graph of the cavity-length dependence of threshold currentdensity (J_(th)) for 12 μm wide silver clad nitride laser diode, forroom temperature pulsed operation, according to the embodiment shown inFIG. 13.

DETAILED DESCRIPTION

We begin with consideration of longer wavelength devices (by which wemean devices which emit at 480 nm or longer). It will be understood,however, that the present invention is not limited to such longerwavelength devices. Also, we use a laser diode as an exemplary structurein the description below, however it will be understood that the presentdisclosure applies to a variety of light emitting devices, and is notlimited to any one structural component. As described above, it isdifficult to achieve sufficient transverse optical confinement inblue-green wavelength nitride-based light emitting devices such as laserdiodes. This challenge arises from the relatively weak index differencesamong the alloys comprising the heterostructure, combined withlattice-strain limitations. For example, due to these strain and indexlimitations, the typical AlGaN cladding layers used to provideconfinement in conventional 405 nm laser diodes do not providesufficient confinement to reach the green wavelengths.

To address this limitation, we have investigated alternative structures,including alternative cladding layer compositions, and have discoveredthat certain materials provide a workable alternative to known upperconfinement layer structures. In general, such materials must below-loss at the wavelength of emission of the laser device, and haverelatively low electrical resistivity, for example, below 1ohm-centimeter (Ω-cm). Accordingly, the properties of silver (Ag) metalmake it a good candidate for a cladding layer material. Disclose hereinis a Ag-clad waveguide structure viable for nitride (longer wavelength)LDs. However, it will be understood that Ag is but one example of thefamily of materials suitable for an alternative waveguide cladding layeraccording to the present invention.

With reference to FIGS. 2A and 2B, there is shown therein a schematicillustration of structures 20A and 20B according to the presentdisclosure. Structure 20A comprises a standard sapphire (Al₂O₃) or GaNsubstrate 22, on which is formed a GaN template layer 24. The activeregion 28 comprises a relatively conventional InGaNmultiple-quantum-well (MQW) adjusted for 500 nm emission, for examplewith In composition in the range of 25-30%. MQW 28 is embedded in anInGaN separate confinement heterostructure (SCH) 30. InGaN SCH may bebulk material 30A, shown in FIG. 2A or, alternatively, may be formedwholly or partially from an InGaN short-period superlattice (SPSL) 30B,shown in FIG. 2B. In the latter case, the SPSL functions to suppressthreading dislocations which might otherwise form and thread upward fromthe strained InGaN/AlGaN interface.

According to one embodiment of the present invention, the structure isprovided with a transverse waveguide which is asymmetric across theactive region. As will be discussed in detail below, above InGaN SCH30A, B, an alternative cladding layer 32 is provided. Cladding layer 32has a number of unique criteria. First, is it highly opticallyreflective at the wavelength of operation of the active layer. This maybe quantified, for example, by examining the complex index of refractionof the selected material. Second, the material is relatively highlyconductive. This may be quantified, for example, by examining the bulkresistivity of the selected material. While the actual material selectedfor cladding layer 32 will vary from application to application, oneexample discussed further below which meets these criteria is metallicsilver.

The n-side of the laser structure may optionally include an n-AlGaNlayer 26 to serve as a cladding layer. The AlGaN layer is optional dueto the thick GaN substrate/template which itself may serve as a lowercladding layer. Whether the additional n-AlGaN layer 26 is provided ornot, it will now be appreciated that the lower and upper cladding layersare of different materials, and very likely of different thicknesses,even though the cladding pair provide waveguiding in the plane of thelayers (i.e., transverse waveguiding). Accordingly, we refer to thissystem as an asymmetric transverse waveguide.

Focusing now on cladding layer 32, the high reflectivity is required tominimize optical loss. Accordingly, the complex index of refraction ofthe material is an important measure. In general, a complex index ofrefraction is defined as:ñ=n+iκwhere n is the real portion or refractive index, and κ is the imaginaryportion or extinction coefficient, which indicates the amount ofabsorption loss when the electromagnetic wave propagates through thematerial. An examination of the complex index of refraction will provideinformation about the reflectivity of the selected material. Thereflectivity of light arriving at normal incident to the cladding layeris given by

$R = \frac{\left( {n - n_{i}} \right)^{2} + \left( {\kappa - \kappa_{i}} \right)^{2}}{\left( {n + n_{i}} \right)^{2} + \left( {\kappa + \kappa_{i}} \right)^{2}}$where n_(i) and κ_(i) are the refractive index and the extinctioncoefficient, respectively, of the material from where light is incidentfrom.

In a waveguide structure, the cladding reflectivity seen by the guidedwave depends on the “direction vector” of the guided wave. Nevertheless,the reflectivity at normal incidence, R, is a simple and convenientmeasure that can be used when selecting materials for the claddinglayer. Once chosen, the actual performance of the selected material as acladding layer should then be evaluated by numerical simulation of thewaveguide.

A desirable cladding material should exhibit a high reflectivity. Ifthis condition is satisfied, the optical mode experiences only a verysmall penetration into the material, and low modal loss can be achievedeven if the cladding material has a high extinction coefficient.

A candidate cladding material that has a very small real component ofthe complex index will have a large refractive index mismatch withrespect to the semiconductor. Since the mismatch appears on thenumerator of the expression for R, such a material would be a promisingcandidate for providing the desired high reflectivity because a highnormal incidence reflectivity correlates with a high guided modereflectivity. Silver, for example, would be a promising candidate forthe cladding material because it has a low refractive index.

Cladding layer 32 also serves as an ohmic contact, and thereforerelatively low bulk resistance is required. Certain high work-functionmetals are one category of materials with desirable low electricalresistance. However, most high-work-function metals (e.g., Pd, Pt, Ni)which are available for forming ohmic contact to p-type nitrides do notsatisfy this low-index criteria. Hence, they are very optically lossy,so that for conventional nitride LD structures a sufficiently thickp-cladding layer must be grown over the active region in order tocontain the evanescent tail of the mode and thereby suppress its overlapwith the absorptive metal. Silver is an exception, as its real index nis low throughout the entire visible spectrum. Moreover, it is ahigh-work-function material which may form a low-resistance ohmiccontact to p-type nitride semiconductors. Consequently, silver is onematerial satisfying the low optical loss, high conductivity requirementsso as to be substitute for the p-type semiconductor cladding layer.Indeed, such a material may also function as the upper p-contact for thedevice.

FIG. 3 is a plot of the complex index, ñ, values for silver. The realcomponent, n, of silver's complex index is very small (below about 0.3for wavelengths above 350 nm, particularly in the range of about 480-550nm), extending through the entire visible spectrum. Using these indexvalues, a Ag-clad LD structure of the composition shown in FIG. 2, wassimulated. The simulation was for a device operating at a wavelength of500 nm.

Table 1 tabulates the normal incident reflectivity of silver and nickelfor light propagating from a GaN layer. Note that Ag is a much betterreflector than Ni for wavelengths ranging from 365 nm to 530 nm.Therefore, Ag is a good choice for a cladding material in the GaNsystem. Other cladding material choices may be suitable for otherwavelengths in other material systems, such as the red or near infra-redwavelengths in the GaAs or InP systems.

TABLE 1 Ni Ni GaN wavelength (um) Ag (n) Ag (k) (n) (k) (n) GaN (k)R_(Ag) R_(Ni) 0.3647 0.186 1.61 1.61 2.23 2.71 1.41E−02 0.8087 0.25830.3757 0.2 1.67 1.61 2.26 2.65 3.34E−06 0.8057 0.2661 0.3875 0.192 1.811.61 2.3 2.60 1.27E−09 0.8197 0.2724 0.4 0.173 1.95 1.61 2.36 2.572.02E−13 0.8429 0.2818 0.4133 0.173 2.11 1.61 2.44 2.54 5.56E−17 0.85120.2943 0.4275 0.16 2.26 1.62 2.52 2.51 1.43E−20 0.8687 0.3051 0.44280.157 2.4 1.62 2.61 2.49 3.64E−24 0.8775 0.3194 0.4592 0.144 2.56 1.642.71 2.47 5.92E−28 0.8937 0.3316 0.4769 0.132 2.72 1.66 2.81 2.451.14E−31 0.9080 0.3437 0.4959 0.13 2.88 1.67 2.93 2.43 2.67E−35 0.91490.3605 0.5166 0.13 3.07 1.71 3.06 2.42 5.32E−39 0.9210 0.3734 0.53910.129 3.25 1.75 3.19 2.41 0.00E+00 0.9269 0.3862

The constitution of the structure 40 and corresponding index values ofthe respective layers thereof are illustrated in FIG. 4, and describedin Table 2, below.

TABLE 2 Layer composition Index, n Ag (56) 0.13 + 2.95iIn_(0.10)Ga_(0.90)N p-SCH (54) 2.456 (15 nm) In_(0.05)Ga_(0.95)N p-typeEBL (52)  2.44 (15 nm) (4 × 3) nm In_(0.27)Ga_(0.73)N QWs (50) 2.54 (3nm) (5 × 7 nm) In_(0.12)Ga_(0.88)N barrier (48) 2.463 (7 nm) In_(0.10)Ga_(0.90)N n-SCH (46) 2.456 Al_(0.07)Ga_(0.93)N clad (44) 2.41 GaN (42) 2.426 evaluated at wavelength λ = 500 nm

Transverse guided-mode simulations were performed for this silver-cladstructure. For the fundamental TE mode, the optical confinement factor(Γ) and the mode loss (α) due to the silver cladding/p-contact weredetermined. The tradeoff between Γ and α was examined, and thestructural parameters were adjusted to optimize this tradeoff.Specifically, the In_(0.1)GaN lower- and upper-SCH layers 46, 54 wereadjusted to maximize the optical confinement factor value, and the lossand Γ values were evaluated for several different Al_(0.07)GaN lowercladding layer 44 thicknesses. All simulations assumed a wavelength of500 nm. It should be appreciated that, the results of this investigationalso translate to any wavelength for which silver is a strong reflector,i.e., λ>350 nm, as shown by its dispersion characteristic in FIG. 3.

FIG. 5 shows the aggregate Γ value, Γ_(total), for a conventional 405 nmlaser, as a function of the number of 3 nm InGaN QWs. For a 4-QWstructure Γ is ˜4%, or 1% per QW. For comparison, the Γ_(total) valuesfor the 4 QW, 500 nm LD with silver cladding are also represented. Fivepoints are shown, corresponding to the cases of different Al_(0.07)GaNlower cladding layer thicknesses, including 0 nm (i.e., no AlGaN lowercladding layer), 250 nm, 500 nm, and 1000 nm thickness. Also shown arethe data for a 250 nm thick lower cladding layer of Al_(0.15)GaN. Foreach of these two compositions, the largest thickness represents theapproximate strain limit for a film grown epitaxially on a GaN template.Likewise for each case, the SCH layer thicknesses are adjusted to givethe maximum Γ_(total) value. The optimum values for the SCH thicknesswill ultimately depend on the tradeoffs between Γ_(total), α_(metal),and the gain-current characteristic of the QW gain medium. An example ofthe transverse near-field mode intensity profile is shown in FIG. 6 forthe case of no AlGaN lower cladding layer (i.e., the lower cladding isentirely GaN).

A summary of Γ_(total) and the mode loss due to the metal cladding areindicated in Table 3, below, along with the In_(0.1)GaN SCH thicknessesthat maximize Γ_(total). Similarly, these Γ_(total) and α_(metal) valuesare plotted in FIG. 7. And for comparison, the values for a conventional405 nm 4×3 nm In_(0.1)GaN QW LD are also indicated (dashed lines in FIG.7). The Ag-clad 500 nm LD structure has somewhat lower Γ_(total), andsignificantly greater loss, attributed to the metal. Including an AlGaNlower cladding layer contributes greater confinement for higher Γ, butit also causes a significant increase in loss due to absorption by thesilver-metal cladding layer on the opposite side of the waveguide. Thelowest α_(metal) loss is achieved for the AlGaN-free structure. Whilethe loss is higher than that of a conventional 405 nm laser, the totalloss for the Ag-clad structure compares more favorably with that of aconventional 405 nm LD. This is so because of the additional lossassociated with p-type doped layers, with an inferred local loss of ˜60cm⁻¹ for the p-type cladding layers (presumably due to scattering byMgN_(x) precipitates, inversion-domain boundaries, defect-levelabsorption, or intervalence band absorption). It is expected that theloss due to the p-type material (α_(p-doping)) will be lower for the 500nm structure for these reasons:

-   -   1. Due to the strong asymmetry inherent in the Ag-clad structure        and associated mode (see FIG. 6), there is less mode overlap        with the p-type layers in the Ag-clad structure; and    -   2. The p-type layers in the Ag-clad structure are InGaN rather        than AlGaN, therefore the acceptor activation energy is lower        and less doping is required to achieve a given hole        concentration.

TABLE 3 Lower Clad SCH_(optimum) (n, p) Γ_(total) α_(metal) Al_(0.07)GaN1000 nm 97, 241 nm 3.6% 45 cm⁻¹ 500 nm 117, 256 nm 3.5% 39 cm⁻¹ 250 nm134, 276 nm 3.3% 32 cm⁻¹ 0 nm(GaN) 110, 299 nm 3.0% 26 cm⁻¹ Al_(0.15)GaN250 nm 145, 263 nm 3.5% 38 cm⁻¹ Conventional 405 nm 4QW LD 4.1% 10 cm⁻¹

We have also attempted to quantify and compare the mode losscorresponding to the p-doped layers of the conventional andsilver-cladded structures. By assuming that the p-type layers have abulk loss of 60 cm⁻¹, the mode loss due to p-doping is simply thespatial overlap of the normalized optical mode with this local loss inthe p-doped layers. These α_(p-doping) values are shown by dashed linesin FIG. 7 as 25 cm⁻¹ for a conventional 405 nm LD, and 21 cm⁻¹ for the500 nm Ag-clad LD with GaN lower cladding, for a total mode loss(α_(total)=α_(p-doping)+α_(metal)) of 35 cm⁻¹ and 48 cm⁻¹, respectively(also shown by dashed lines in FIG. 7). The lower p-doping loss for theAg-clad structure reflects its asymmetric mode shape as evidenced inFIG. 6.

These simulations serve to show that the Ag-clad structure offersacceptable Γ_(total) and α_(metal) values. Additional optimization ofother structural parameters (SCH composition, graded compositions,doping profile, etc.) may lead to further improvement. Most importantly,this is accomplished without AlGaInN cladding layers. Thus, the Ag-cladstructure is well targeted to longer wavelength devices (e.g., greenLDs), particularly because excessive strain may limit the practicalityof conventional structures. But again, it must be realized that theasymmetric cladding, with the upper cladding being optically reflectiveand electrically conductive, is also applicable at shorter wavelengths.

The mode loss may be further reduced by inclusion of a phase matchinglayer 62 between the metal and the p-type semiconductor surface. Atransparent conductor such as indium-tin-oxide (ITO) could be used asthe phase matching layer. Other transparent conductors are also viable,for example zinc oxide (ZnO) or indium zinc oxide (IZO). This modifiedstructure is shown in FIG. 8 using ITO as an example. The measureddispersion characteristics of the ITO transparent electrode are shown inFIG. 9.

The dispersion characteristics in FIG. 9 represent the n (solid curves)and κ (dashed curves) values for an ITO film analyzed assuming twocomponents: a portion near the deposition interface (“bottom”, singlecurve), and the top of the film (“top”, double curve). The real part ofITO's refractive index is about 2, or a few tenths less than that ofGaN, and its imaginary component is much smaller than for a metal.Consequently, for a structure with a composite ITO+Ag cladding layer,the mode loss may be reduced compared to a metal-only cladding layer.

Furthermore, in certain applications, this structure is additionallyadvantageous because it separates the ohmic contact function from thewaveguide cladding-layer function. These two requirements often conflictand must be traded-off against each other, i.e., it is difficult to finda metal which offers both the requisite high work function and low modeloss. For the composite ITO+Ag cladding structure, ITO serves as theohmic contact, and the choice of overlying metal is not so limited tometals such as silver, which have a high work function. Rather, a muchwider range of reflective materials becomes viable, so long as thematerial properties allow for a low modal absorption loss. Thus, oneembodiment incorporates ITO and n- and p-SCH layers whose thicknessesand compositions are adjusted to maximize the Γ_(total) value and/orminimize the mode loss α. A comparison of these values for Ag-clad andITO+Ag-clad lasers, at a wavelength of 500 nm (for the structureindicated in FIG. 4), is shown in Table 4, below (assuming ITO indexcorresponding to the “bottom” material). By inserting a 50 nm layer ofITO between the p-InGaN and silver, the mode loss can be significantlyreduced from 45 cm-¹ to 31 cm⁻¹, without compromising the opticaloverlap Γ.

TABLE 4 Ag Ag + ITO n-SCH 100 nm 100 nm P-SCH 239 nm 218 nm ITO — 50 nmΓ_(total) 4QW (%) 3.6 nm 3.6 nm α (cm⁻³) 45 nm 31 nm

A structure 70 incorporating ridge waveguides may also be constructedfrom this silver or Ag+ITO clad structure, as shown in FIG. 10. Over asubstrate (not shown), an n-AlGaN lower cladding layer 72 is formed. Anactive region 76 of the type previously described is formed betweenlower n-InGaN SCH 74 and upper p-InGaN 78. A region of ITO is thendeposited and patterned to form a ridge structure 80, then a passivationlayer 82 such as of SiNx is deposited. Finally, an upper cladding layer84 such as silver metal is deposited.

A positive lateral index guide is formed by etching away a portion ofthe upper p-SCH outside the laser stripe. For example, by etching away50 nm of the p-SCH from the optimized Ag+ITO-clad 500 nm structuredescribed in Table 4, above (i.e., reducing its thickness from 218 nm to168 nm), the mode effective index is depressed by approximately 0.005.This is a reasonable value for forming a single-mode waveguide, andtypical of conventional ridge waveguides. Accordingly, the ridge widthand etch-depth (which determines the lateral index step) should beoptimized in the normal manner, to give the following performancecharacteristics:

-   -   1. Low threshold current;    -   2. Low fundamental mode loss; and    -   3. Strong mode discrimination (e.g., high loss and/or lower gain        for high-order modes), for stable single-mode operation.

In additional embodiments 90, 92 of the present invention, the Ag-cladstructure forms a distributed feedback (DFB) or distributed Braggreflector (DBR) laser. With reference to FIGS. 11 and 12, a metalcladding layer 94 is formed as a grating of periodic stripes 96 ofsilver metal, or Ag+ITO. This structure may be formed over a lateralridge waveguide 98, as shown in FIGS. 11A and 11B, or the currentinjection may define a gain-guided stripe 100 as shown in FIG. 12. Incomparison to a more traditional etched (surface corrugation) grating,the metal grating provides complex coupling (i.e., periodic indexvariation accompanied by a gain/loss modulation) that favors single-modeoperation.

As a specific example, a 412 nm 4×3 nm In_(0.1)Ga_(0.9)N quantum wellnitride laser diode in which the upper cladding layer is silver metalhas been demonstrated. The Ag-clad nitride LD structure is shown in FIG.13. The n-side is similar to conventional GaN-based LDs, including a 750nm Al_(0.14)Ga_(0.86)N/GaN (3/3 nm), (0001)-oriented short-periodsuperlattice cladding layer deposited over a thick n-type GaN/sapphiretemplate. The active region consists of 4×In_(0.1)Ga_(0.9)N/GaN (3/6 nm)quantum wells, embedded in a GaN separate confinement heterostructure(SCH). A p-type Al_(0.2)Ga_(0.8)N:Mg electron blocking layer isdeposited over the last GaN barrier. The silver metal cladding isapplied directly over the p-type SCH layer, replacing the p-type AlGaNcladding layer typical of conventional nitride LD structures. Thethicknesses of the n- and p-type SCH layers are designed throughtransverse waveguide simulations, to determine the QW confinement factor(Γ) and the mode loss (α) associated with the silver metal cladding, forthe fundamental TE mode.

At a wavelength of 410 nm, the complex index of silver is n=0.17+2.0i,representing a huge index discontinuity with respect to GaN.Consequently, when silver metal is applied as a waveguide claddinglayer, the confined optical mode experiences a very abrupt decay in thesilver.

The nitride LD heterostructure was prepared by metalorganic chemicalvapor deposition (MOCVD) using trimethyl-group-III precursors, ammonia,silane and biscyclopentadienylmagnesium for n- and p-type doping, in H₂and N₂ carrier gases. The n-type AlGaN cladding layer was deposited at apressure of 200 Torr, while all other layers were grown at an elevatedpressure of 700 Torr for best optical efficiency and p-type doping.Subsequently, mirrors and n-contact pads were formed bychemically-assisted ion-beam etching (CAIBE). The silver cladding wasformed by evaporating 200 nm silver, followed by 500 nm gold. Then-contact electrode was formed with a Ti—Au metallization. Cavitylengths were 300, 400, 500, 700, 1000, and 1500 μm, with uncoated(as-etched) mirrors; and the stripe width of the simple gain-guided LDswas 12 μm. The diodes were tested under pulsed conditions at roomtemperature, with 100 nsec pulse width, and 1 kHz repletion rate.

The pulsed light vs. current characteristic for a 12 μm×1000 μm stripeis shown in FIG. 14. The threshold current is 1.4 A, corresponding to athreshold current density of about 12 kA/cm². At threshold, a far-fieldpattern emerged (with interference fringes produced by reflection fromthe etched surfaces in front of the mirror), indicative of spatialcoherence and lasing. The lasing wavelength at 1.5 A pulsed current was412 nm, as indicated in the spectrum shown in FIG. 15. The cavity-lengthdependence of threshold current density (J_(th)) is likewise shown inFIG. 16. For long (L>1000 μm) cavities, J_(th) is relatively insensitiveto length, due to the dominance of the distributed loss α; while forshort cavities J_(th) is very high, due to the changing mirror losscombined with the sublinear gain vs. current characteristic typical ofQWs. Thus, this cavity-length dependence of J_(th) is roughly consistentwith the estimated mode loss of about 30 cm⁻¹. The lowest measuredJ_(th) was about 10 kA/cm², for a 1500 μm cavity.

The silver-clad LD heterostructure offers several advantages overconventional structures. First, the absence of a semiconducting p-AlGaNcladding layer makes the structure relatively simple, and can lower boththe series resistance and thermal resistivity, and inhibit cracking.Furthermore, with only minimal material required over the active region,the InGaN QW quality may be preserved against any degradation associatedwith the time/temperature exposure which would otherwise occur duringgrowth of a thick p-AlGaN cladding layer. This benefit is especiallysignificant for high-indium content structures, due to the inherentthermal instability of InGaN.

We have found that the overall mode loss may be made acceptably small.Indeed, although the loss arising from absorption in the metalclad/contact is greater than that of a conventional nitride LDstructure, the large asymmetry in the mode leads to lower loss from themode's overlap with the p-type (Mg-doped) layers. Thereby, the overalldistributed loss is within practical limits. And for long wavelength(blue-green) nitride LDs, the mode loss resulting from the silver metalmay be further reduced by introduction of an ITO layer between the p-SCHand the silver.

Although the specific embodiments described in this disclosure arefocused on laser diodes made in the GaN material system, the samenon-epitaxial upper cladding laser structures can be readily extended toother material systems such as the GaAs and InP system. The operatingwavelengths would be different for different material systems. Forexample, GaAs-based laser diodes would typically operate at wavelengthsbetween 630 nm and 1000 nm, and InP-based diodes would typically operateat wavelengths between 1200 nm and 1700 nm. The preferred upper claddingmaterial could be different for light-emitting structures made indifferent material systems because the refractive indices andreflectivities of materials depend on wavelength. However, the basicphysics would be the same. Moreover, other light-emitting devices suchas superluminescent light-emitting diodes are possible. Superluminescentdiodes are similar to laser diodes in that they utilize an opticalwaveguide, but optical feedback is suppressed.

The physics of modern electrical devices and the methods of theirproduction are not absolutes, but rather statistical efforts to producea desired device and/or result. Even with the utmost of attention beingpaid to repeatability of processes, the cleanliness of manufacturingfacilities, the purity of starting and processing materials, and soforth, variations and imperfections result. Accordingly, no limitationin the description of the present disclosure or its claims can or shouldbe read as absolute. The limitations of the claims are intended todefine the boundaries of the present disclosure, up to and includingthose limitations. To further highlight this, the term “substantially”may occasionally be used herein in association with a claim limitation(although consideration for variations and imperfections is notrestricted to only those limitations used with that term). While asdifficult to precisely define as the limitations of the presentdisclosure themselves, we intend that this term be interpreted as “to alarge extent”, “as nearly as practicable”, “within technicallimitations”, and the like.

Furthermore, while a plurality of preferred exemplary embodiments havebeen presented in the foregoing detailed description, it should beunderstood that a vast number of variations exist, and these preferredexemplary embodiments are merely representative examples, and are notintended to limit the scope, applicability or configuration of thedisclosure in any way. Various of the above-disclosed and other featuresand functions, or alternative thereof, may be desirably combined intomany other different systems or applications. Various presentlyunforeseen or unanticipated alternatives, modifications variations, orimprovements therein or thereon may be subsequently made by thoseskilled in the art which are also intended to be encompassed by theclaims, below.

Therefore, the foregoing description provides those of ordinary skill inthe art with a convenient guide for implementation of the disclosure,and contemplates that various changes in the functions and arrangementsof the described embodiments may be made without departing from thespirit and scope of the disclosure defined by the claims thereto.

1. A semiconductor light emitting device, comprising: a substrate; acrystalline semiconductor cladding layer formed over said substrate; aconfinement heterostructure formed over said crystalline semiconductorcladding layer; an active region formed within said confinementheterostructure; a phase matching layer formed over and in physicalcontact with said confinement heterostructure, said phase matching layersubstantially optically transparent at the wavelength of operation ofsaid semiconductor light emitting device; a non-epitaxial cladding layerformed over and in physical contact with said phase matching layer, saidnon-epitaxial cladding layer having an electrical resistivity less than1 ohm-cm; and wherein said phase matching layer comprises a materialselected from the group consisting of: indium tin oxide (ITO) and zincoxide (ZnO).
 2. The semiconductor light emitting device of claim 1,wherein said confinement heterostructure comprises a material selectedfrom the group consisting of: aluminum, indium, gallium.
 3. Thesemiconductor light emitting device of claim 1, wherein saidnon-epitaxial cladding layer is comprised of a metal.
 4. Thesemiconductor light emitting device of claim 3, wherein saidnon-epitaxial cladding layer is comprised of silver (Ag).
 5. Thesemiconductor light emitting device of claim 1, wherein saidnon-epitaxial cladding layer is both an upper cladding layer and ap-contact layer for the light emitting device.
 6. The semiconductorlight emitting device of claim 1, wherein said non-epitaxial claddinglayer is formed as a stripe over said confinement heterostructure tothereby provide a ridge waveguide.
 7. A semiconductor light emittingdevice, comprising: a substrate; a crystalline semiconductor claddinglayer formed over said substrate; a confinement heterostructure formedover said crystalline semiconductor cladding layer; an active regionformed within said confinement heterostructure; a phase matching layerformed over and in physical contact with said confinementheterostructure, said phase matching layer substantially opticallytransparent at the wavelength of operation of said semiconductor lightemitting device; a non-epitaxial cladding layer formed over and inphysical contact with said phase matching layer, said non-epitaxialcladding layer having an electrical resistivity less than 1 ohm-cm; andfurther comprising a dielectric layer, formed as a stripe over saidconfinement heterostructure and below said non-epitaxial cladding layer,and further wherein said non-epitaxial cladding layer is a periodicgrating comprising discontinuous lateral ridge waveguide elementsselectively formed over said dielectric layer.
 8. The semiconductorlight emitting device of claim 1, wherein said non-epitaxial claddinglayer forms an optical gain guide.
 9. The semiconductor light emittingdevice of claim 1, whereby said active region comprises indium galliumnitride (InGaN), and said semiconductor light emitting device emitslight having a wavelength in the range of 350-550 nm.
 10. Thesemiconductor light emitting device of claim 1, wherein saidsemiconducting light emitting device is a semiconductor diode laser. 11.The semiconductor light emitting device of claim 1, wherein saidsemiconducting light emitting device is a superluminescent diode. 12.The semiconductor light emitting device of claim 1, wherein saidnon-epitaxial cladding layer is a composite comprising a conductingoxide and a metal.
 13. The semiconductor light emitting device of claim1, whereby said active region comprises indium gallium aluminum nitride(InGaAlN), and said semiconductor light emitting device emits lighthaving a wavelength in the range of 350-550 nm.
 14. The semiconductorlight emitting device of claim 13, wherein said non-epitaxial claddinglayer comprises a metal having a real component of its refractive indexnot exceeding 0.3 for wavelengths above 350 nm.
 15. The semiconductorlight emitting device of claim 1, wherein said phase matching layer hasan optical reflectivity exceeding 0.5 for light propagating from saidconfinement heterostructure.